𝗪𝗮𝗳𝗲𝗿 𝗺𝗲𝘁𝗿𝗼𝗹𝗼𝗴𝘆 𝘀𝗵𝗼𝘂𝗹𝗱𝗻’𝘁 𝘀𝗹𝗼𝘄 𝘁𝗵𝗲 𝗳𝗮𝗯 𝗱𝗼𝘄𝗻. Park NX-Wafer is built to keep precision moving with fully automated AFM workflows for advanced manufacturing environments. 𝗔𝘂𝘁𝗼𝗺𝗮𝘁𝗶𝗼𝗻 𝘁𝗵𝗮𝘁 𝘄𝗼𝗿𝗸𝘀 𝘄𝗵𝗲𝗿𝗲 𝗶𝘁 𝗰𝗼𝘂𝗻𝘁𝘀: ✔ Wafer loading and handling ✔ Auto probe exchange ✔ Recipe-driven measurement ✔ SECS/GEM fab host integration ✔ Automated analysis and reporting 𝗧𝗵𝗲 𝗡𝗫-𝗪𝗮𝗳𝗲𝗿 𝗹𝗶𝗻𝗲𝘂𝗽: 🔹 NX-Wafer: automated AFM for advanced semiconductor metrology 🔹 NX-Wafer 200: built for 150 mm and 200 mm wafer production 🔹 NX-Wafer Plus: expanded capability for CMP, 3D nano-metrology, and advanced structures 💡𝗦𝗲𝗲 𝘁𝗵𝗲 𝗽𝗿𝗼𝗱𝘂𝗰𝘁 𝗹𝗶𝗻𝗲: okt.to/aEGqno #Semiconductor #WaferMetrology #AFM #Automation #MEMS #CMP #DefectReview #ProcessControl #ParkSystems

#FAMT2022: Meet the KEYNOTE SPEAKERS at the Failure Analysis and Material Testing Symposium for semiconductor device applications: #Samsung #imec #Fraunhofer #ParkSystems #MolecularVista #PrimeNano Become a speaker: okt.to/E7wZvf #FA #semiconductors #spm #defectreview

Detect the defect: advantages of inline automated AFM for Semiconductor Applications. Learn about the Automatic Defect Review (ADR AFM) - a tool for inline or offline wafer inspection to generate 3D images of defects: bit.ly/3pklpYe #ADR #semiconductors #defectreview