Accel-RF Instruments Corporation is the worldwide leader in integrated RF accelerated reliability test systems for compound semiconductor devices.
Joined July 2012
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The Types of Semiconductor Reliability Testing Guide explores the different types of tests needed to qualify semiconductor devices, and which tests are useful for device characterization and quality assurance as those products leave the production line: hubs.ly/Q01Lrx3z0
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While many people recognize the importance of #semiconductor reliability testing, it can be difficult to understand where to begin with so many different kinds of test types. Check out our comprehensive guide to semiconductor #ReliabilityTesting! hubs.ly/Q01Lrw7G0
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Check out our @MicrowavesRF QuickChat to learn:
✔️The history of Compound Semiconductor reliability
✔️How the landscape for wide bandgap applications has changed in the past decade
✔️Where Compound Semiconductor technology is now
Watch now: hubs.ly/Q01DzYCH0
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Roland Shaw, President of Accel-RF, sits down with David Maliniak for a @MicrowavesRF QuickChat to discuss the history of compound semiconductor reliability and how test needs evolve with the product lifecycle curve.
Watch here: hubs.ly/Q01DzT0X0
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Download free guides, watch webinars, and learn more about #reliabilitytesting all from our new Resource Hub.
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Want to know more about #ReliabilityTesting? Find everything you need to know about reliability testing from Accel-RF’s reliability experts with our product demos, webinars, blogs, videos, and free guides.
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Accelerated life testing and burn-in are two test methods that demonstrate the quality and reliability assurance for today's RF devices. But, what differs between these two methods? Read the article to learn more.
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Accelerated life testing provides the statistical data and industry-standard performance metrics needed to compete in the #semiconductor market. Download the eBook and learn how accelerated life testing can improve your bottom line.
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Are we ready for Gallium-Nitride semiconductor mainstream deployment? For a technology to gain wide acceptance, it must first show itself reliable for the conditions in which it operates. Read the article to learn more.
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When it comes to reliability testing, there are several configurable options that need to be determined to perform the desired tests. Watch the demo to learn the process, how to configure your system to fit your needs, and more.
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Accelerated-life testing (ALT) is widely used throughout the semiconductor industry, but it isn't without shortcomings. Read the article to learn about its challenges and how to overcome ALT hurdles to realize market triumph.
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What does it mean to engineer with reliability in mind? And how can the reliability & quality of devices be proven fast enough to satisfy customer demand and market requirements to ensure a significant ROI? Watch the webinar to learn more.
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Contrary to belief, homegrown reliability test equipment typically results in an expensive, schedule-busting mistake. Read the article now to learn about the 4 other myths you need to know in semiconductor reliability testing.
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We have gathered all of our videos on 5G, GaN and reliability testing in one convenient place. Check out our knowledge base video library! #ReliabilityTesting #CustomerSupport
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Burn-in testing is one of the keystones for providing statistically-driven confidence to semiconductor manufacturing. Read the article to learn how to use results to improve quality & reliability assurance over the life cycle of a device.
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GaN is relatively new & lacks 1 thing that can act as a deterrent for widespread adoption – long-term reliability statistics that fit the current paradigm. Read the article to see if we're ready for GaN semiconductor mainstream deployment.
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Industries where we apply semiconductor technology are driving manufacturers to have a reliability assurance-driven culture within their companies. Watch the webinar to learn about comparison analysis, understanding failure rates, and more.
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Reliability testing increases companies' chances of making a profit on new designs and helps foster more innovation in the industry. Read the article to learn about test validity and the different types of reliability testing.
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Finding the right mix of discrete and integrated solutions that meet the efficiency and reliability demands of 5G is a challenge. Download the whitepaper to learn more about the role of reliability testing for 5G devices.
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DC testing is less costly and plays a vital role in verifying intrinsic reliability characteristics of newly designed ICs, but it can't take the place of RF testing to determine suitability for an application. Read the article to learn why.
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