Today, #CXLConsortium and @JEDEC announced the signing of a Memorandum of Understanding (MOU) to advance DRAM and persistent memory technology by forming a joint Work Group.
Read the announcement to learn more: bit.ly/3QJNliN
The new JEDEC UFS 4.0 leverages industry–leading specifications from @MIPI_Alliance to form its Interconnect Layer: M-PHY® version 5.0 specification and UniPro® version 2.0 specification to double the UFS interface bandwidth. More here: jedec.org/news/pressreleases…
Now published: JEDEC Universal Flash Storage (UFS) 4.0, UFSHCI 4.0 and a new companion standard, UFS File Based Optimization. More info here: jedec.org/news/pressreleases…
Read Nick Flaherty's recent article in @EENewsEurope, "MIPI doubles data rate of UniPro memory specification" to learn more about the updates in #MIPI UniPro v2.0: bit.ly/3QxjHxi#FlashStorage @JEDEC@
Advance registration discounts for ROCS (Reliability of Compound Semiconductors) Workshop EXTENDED until Sunday, May 1: jedec.org/events-meetings/ro… Join us in Monterey, CA on May 9!
LAST CHANCE to register for ROCS (Reliability of Compound Semiconductors) Workshop in Monterey, CA on May 9, co-located with the CS MANTECH. Discounts end this Friday: jedec.org/events-meetings/ro…
Join us for the ROCS (Reliability of Compound Semiconductors) Workshop in Monterey, CA on May 9, co-located with the CS MANTECH. Discounts end soon: jedec.org/events-meetings/ro…
JEDEC's JC-15 committee holds its next meeting on Nov. 2 and is taking on challenging thermal problems to meet the changing applications of electronic packages. Contact JEDEC to join and participate: jedec.org/contact
Join our team! Interested in supporting the development of open industry standards? JEDEC has open positions for a technical committee secretary and a technical editor/writer. Both are part-time contract positions and are entirely remote. Info: jedec.org/home
ROCS is back - online! Register today for ROCS (Reliability of Compound Semiconductors) Workshop to be held on Monday, May 24 alongside the CS MANTECH Conference on its virtual conference platform: jedec.org/events-meetings/ro…
New guideline from JC-70.2 - JEP184: Guideline for Evaluating Bias Temperature Instability of Silicon Carbide Metal-Oxide-Semiconductor (MOS) Devices for Power Electronic Conversion. Free download: jedec.org/standards-document…
JEDEC Wide Bandgap Power Semiconductor Committee Publishes its First Guideline for Silicon Carbide (SiC) Based Power Conversion Devices jedec.org/document_search?se…