Metal alloys have accompanied humans from the Bronze Age, and today they drive innovation in several fields.
For advanced semiconductor applications, it is fundamental to characterize metal alloys at nanoscale, and to make sure they have the right properties. Thanks to its versatility and precision, atomic force microscopy is the perfect technique to tackle this challenge.
Now, Nanosurf's DriveAFM can deliver the highest image quality at unprecedented speed, thanks to its unique WaveMode, the fastest off-resonance AFM technique on the market. Joined with our FastScanning add-on, it can scan areas of many square microns with 512 x 512 pixels in under 35 s!
And if you need accurate nanomechanics measurements, our DriveAFM can perform WaveMode NMA: quantitative, easy to use, fast.
☑️ WaveMode → fastest off-resonance AFM mode on DriveAFM.
☑️ WaveMode NMA → quantitative elasticity topography in one scan.
☑️ Visualize phase variations quickly and accurately.
Curious to read more? Here it is our blog article on metal alloy measurements:
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