Ms. Vaidehi Painter has published her research work titled "Source-connected and gate-connected field-plate influence on thermal resistance of AlGaN/GaN HEMT with varying passivation thickness and field-plate length,” in Microelectronics Reliability Journal. We thank our collaborators Prof. Jean-Christophe Nallatamby and Dr. Raphael SOMMET from XLIM Laboratory, France for their guidance and constant support. This research work is supported by the CNRS-supported International Research Project (IRP) “MEGATRON” — strengthening Indo-French research ties. The paper can be downloaded from personalized Share Link: authors.elsevier.com/c/1m2cY…#IITDharwad#Research#Microelectronics#GaN#HEMT#AlGaN#Semiconductors#DeviceReliability#ThermalManagement#IndoFrenchCollaboration#XLIM#CNRS#MEGATRON
Happy New Year from the Memfault team! 🎉 Wishing you joy, prosperity, and device reliability in 2024.
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This Thursday is the @ST_World Technology Tour in Santa Clara! Come visit Memfault's table (#4) for some fun swag and experience a live demo of our device reliability platform.
Free Registration: hubs.la/Q02c0lsS0#stmicro#iot#devicereliability
Next Thursday is the @ST_World Technology Tour in Santa Clara! Come visit Memfault's table for some fun swag and experience a live demo of our device reliability platform.
Free Registration: hubs.la/Q02bv_6d0#stmicro#iot#devicereliability
Learn about #IoT device reliability engineering, how it can boost your product's performance and quality to keep your customers happy. Join Jim Morrish of IoT Analyst House, Transforma Insights, and François Baldassari, CEO of Memfault bit.ly/444Mkrq#DeviceReliability
Learn about #IoT device reliability engineering and how it can boost your product's performance and quality to keep customers happy. Join Jim Morrish of IoT Analyst House, Transforma Insights, and François Baldassari, CEO of Memfault: buff.ly/3qrCgez#DeviceReliability